| 摘要 |
PCT No. PCT/JP95/02692 Sec. 371 Date Nov. 18, 1996 Sec. 102(e) Date Nov. 18, 1996 PCT Filed Dec. 26, 1995 PCT Pub. No. WO96/20409 PCT Pub. Date Jul. 4, 1996A test pattern transfer apparatus is to improve overall throughput of a semiconductor test system which has an engineering work station for functioning as a host computer, a test controller for controlling an operation of the semiconductor test system and a pattern memory for generating test patterns transferred from a hard disk of the engineering work station. The test pattern transfer apparatus simplifies the pathways for transferring the test patterns so as to reduce the time required for the pattern transfer by directly transferring the test pattern from the work station to the pattern memory without passing through the test controller. The test pattern transfer apparatus includes an interface controller whereby the test pattern from the engineering work station is either directly transferred to the pattern memory or indirectly transferred to the pattern memory through the test controller.
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