HIGH SPEED ROW TEST CIRCUIT,申请号KR19940040591-传众专利搜索

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发明名称	HIGH SPEED ROW TEST CIRCUIT
摘要
申请公布号	KR0144407(B1)	申请公布日期	1998.08.17
申请号	KR19940040591	申请日期	1994.12.31
申请人	HYUNDAI ELECTRONICS IND. CO.,LTD	发明人	CHOE, JAE-MYUNG
分类号	G11C11/406;(IPC1-7):G11C11/406	主分类号	G11C11/406
代理机构		代理人
主权项
地址

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