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发明名称
TEST PATTERN OF SEMICONDUCTOR
摘要
申请公布号
KR0144254(B1)
申请公布日期
1998.08.17
申请号
KR19940023064
申请日期
1994.09.13
申请人
LG SEMICONDUCTOR CO.,LTD
发明人
LEE, BYUNG-ILL
分类号
H01L21/66;(IPC1-7):H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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