| 摘要 |
PROBLEM TO BE SOLVED: To realize a semiconductor device that can suppress the increase of a circuit scale, and can check an inside register at a high speed. SOLUTION: This device is provided with an OR gate 10, which calculates the logical sum of the data of each bit of a register 3, and an output signal S0 of the OR gate 10 is outputted to a test terminal T0 . At the time of check, data '0' are written in each bit of the register 3 by a check control circuit constituted of a CPU or the like, whether or not the output signal S0 is '0' is checked, data '1' are successively written in each bit of the register 3, and the output signal S0 is checked so that the data holding function of the register 3 can be judged. Thus, each bit of the register 3 which can hold plural bit data can be checked through one test terminal T0 , and the check of the register 3 can be realized at a high speed while the increase of a circuit area can be suppressed. |
