发明名称 Method and apparatus for combined glide and defect analysis
摘要 A method and apparatus for detecting defects on the surface of a data recording medium. In one embodiment the present invention includes a sensor for detecting defects on the surface of a magnetic disk. The sensor generates an analog voltage signal that is representative of a surface anomaly detected on the disk surface. An analog signal processor processes the signal before it is received by a peak detecting circuit. The peak detecting circuit detects and converts a peak of the analog signal into digital data. The digital data is received and manipulated by a digital signal processor where the peak amplitude, average peak amplitude and average peak power of the defect may be calculated.
申请公布号 US5792947(A) 申请公布日期 1998.08.11
申请号 US19960634693 申请日期 1996.04.18
申请人 PHASE METRICS 发明人 POGREBINSKY, VLADIMIR;IOSILEVSKY, IGOR;BURT, JR., GEORGE A.;FERRY, DAVID
分类号 G01R33/12;(IPC1-7):G11B5/60;G01B5/28;G01B17/08 主分类号 G01R33/12
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