发明名称 |
Method and apparatus for combined glide and defect analysis |
摘要 |
A method and apparatus for detecting defects on the surface of a data recording medium. In one embodiment the present invention includes a sensor for detecting defects on the surface of a magnetic disk. The sensor generates an analog voltage signal that is representative of a surface anomaly detected on the disk surface. An analog signal processor processes the signal before it is received by a peak detecting circuit. The peak detecting circuit detects and converts a peak of the analog signal into digital data. The digital data is received and manipulated by a digital signal processor where the peak amplitude, average peak amplitude and average peak power of the defect may be calculated.
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申请公布号 |
US5792947(A) |
申请公布日期 |
1998.08.11 |
申请号 |
US19960634693 |
申请日期 |
1996.04.18 |
申请人 |
PHASE METRICS |
发明人 |
POGREBINSKY, VLADIMIR;IOSILEVSKY, IGOR;BURT, JR., GEORGE A.;FERRY, DAVID |
分类号 |
G01R33/12;(IPC1-7):G11B5/60;G01B5/28;G01B17/08 |
主分类号 |
G01R33/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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