发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and its manufacture which can cope with, especially, the further micronization of a semiconductor device, relating to the manufacture technique of the semiconductor device to open a contact hole in conformity with a base pattern. SOLUTION: A semiconductor device is manufactured by the process of forming wiring 18 covered with an insulating film 20 on a base substrate 10, the process of stacking an insulating film 24 and an insulating film 26 in order on the base substrate 10 where the wiring 18 is made, the process of forming an opening in the region including the region where the wiring 18 is made, by etching the insulating film 26 with the insulating film 24 as a stopper, and the process of forming the sidewall 30 consisting of the insulating film 24 at the sidewall of the wiring 18, by etching the insulating film 24 within the opening, and then, forming contact holes 34 and 36 connected with the base substrate 10 in conformity with the wiring 18.
申请公布号 JPH10214894(A) 申请公布日期 1998.08.11
申请号 JP19970015179 申请日期 1997.01.29
申请人 FUJITSU LTD 发明人 NAKAMURA SHUNJI
分类号 H01L21/28;H01L21/60;H01L21/768;H01L21/8234;H01L21/8242;H01L23/522;H01L27/108;H01L29/78 主分类号 H01L21/28
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