发明名称 Photoresist strip method
摘要 An improved method for removing a photoresist mask from an etched aluminum pattern after etching the pattern in a chlorine containing plasma has been created. The method is a two step process, in which a first stripping step is in a plasma containing O2 and H2O and a second stripping step is in a plasma containing O2.
申请公布号 US5792672(A) 申请公布日期 1998.08.11
申请号 US19960618891 申请日期 1996.03.20
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING LTD. 发明人 CHAN, LAP;MENG, SIMON CHOOI YEN;CHAN, TONY
分类号 G03F7/42;H01L21/311;(IPC1-7):H01L21/465 主分类号 G03F7/42
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