发明名称 SENSOR PATTERN INSPECTION DEVICE AND SENSOR PATTERN INSPECTION METHOD
摘要 <p>PROBLEM TO BE SOLVED: To make it possible to judge disconnection, thinning, short-circuit and mixed contact in the conductor of a sensor pattern with a simple system in a short inspection time, by giving an instruction for the sensor pattern to be selected and judging the defect of the conductor of the sensor pattern by a prescribed upper limit or upper and lower limit threshold values from a received voltage. SOLUTION: In a send-out analog switch 2, corresponding to inputted signals, the conductor 3 of one sensor pattern for sending out a current is selected from the conductors 3 of the sensor patterns arrayed plurally. Then, after measurement ended for the conductor 3 of one sensor pattern, by switching the send-out analog switch 7, the voltage generated in the conductor 3 of the sensor pattern is measured on the conductors 3 of all the sensor patterns. Thus, after a voltage value detected in an AS conversion circuit 9 is sent to a CPU 10, in the CPU 10, it is judged that the disconnection and the thinning, etc., are present for the conductor 3 of the sensor pattern for detecting the voltage larger than the prescribed upper limit threshold value.</p>
申请公布号 JPH10214151(A) 申请公布日期 1998.08.11
申请号 JP19970031151 申请日期 1997.01.30
申请人 WACOM CO LTD 发明人 HORIE TOSHIHIKO;SHIMIZU MAKOTO
分类号 G06F3/041;G06F3/03;G06F3/048;(IPC1-7):G06F3/03 主分类号 G06F3/041
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