发明名称 Method of manufacturing semiconductor device
摘要 A method of manufacturing a semiconductor device includes the steps of providing a semiconductor substrate; forming a gate electrode on the substrate; forming impurity regions on both sides of the gate electrode; forming a first sidewall on the side of the gate electrode; forming a second sidewall on the side of the first sidewall; forming a third sidewall on the side of the second sidewall; and selectively removing only the second sidewall to thereby form a contact area. It is possible to precisely form a fine contact area so that the size of a semiconductor device can be reduced.
申请公布号 US5792671(A) 申请公布日期 1998.08.11
申请号 US19960606186 申请日期 1996.02.23
申请人 LG SEMICON CO., LTD. 发明人 LEE, BYOUNG JU
分类号 C23F4/00;H01L21/28;H01L21/285;H01L21/336;H01L21/768;H01L23/522;H01L29/78;(IPC1-7):H01L21/265 主分类号 C23F4/00
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