摘要 |
PROBLEM TO BE SOLVED: To provide an automatic analyzer capable of collecting specimen racks not requiring re-inspection without passing a feedback line in an automatic analyzer capable of performing re-inspection automatically. SOLUTION: Specimen racks 2 are sampled by analyzing parts 6 and 14 located in midcourse of a transport line 3. Also a waiting part 40 and a rack collecting part 23 are arranged near the outlet of the transport line 3. In addition, the sampled specimen racks 2 are sorted at a first switchover part 22 into the waiting part 40 or rack collecting part 23, and the specimen racks stored in the waiting part 40 are sorted into the feedback line 29 or rack collecting part 23 at a second switchover part 27 according to the judgment results on whether the re-inspection is required or not. |