发明名称 THIN FILM ELECTRON SOURCE
摘要 <p>PROBLEM TO BE SOLVED: To improve the voltage resistance so as to stabilize the operation of a thin film electron source, and to prolong the lifetime by using a zondoved diamond thin film for an insulating layer of a thin film electron source, which has the three-layered structure of lower electrode-insulating layer-upper electrode. SOLUTION: In a MIM type thin film electron source, a diamond thin film 5 is formed on a platinum metal base board 4 used as a lower electrode. The diamond thin film 5 is formed by using hydrogen gas, in which acetone at about 1% by weight is mixed, as a raw material gas, and performing a chemical vapor deposition method using microwave plasma. Film thickness of the diamond thin film 5 is set at about 3mm. A metal film 6 as an upper electrode is formed at about 5mm of thickness on the diamond thin film 5. Direct current voltage is applied between the upper electrode 6 and the lower electrode 4. With this thin film electron source, electric breakdown is not generated for 50 hours. Furthermore, electron is stably emitted, restraining the generation of noise.</p>
申请公布号 JPH10208620(A) 申请公布日期 1998.08.07
申请号 JP19970010952 申请日期 1997.01.24
申请人 HITACHI LTD 发明人 YAGUCHI TOMIO;SUZUKI MUTSUZOU;KUSUNOKI TOSHIAKI;SASAKI SUSUMU
分类号 H01J1/30;H01J1/312;H01J29/04;H01J31/12;(IPC1-7):H01J1/30 主分类号 H01J1/30
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