| 摘要 |
<p>Method and machine vision system (16) for detecting defects in an apertured opaque layer (15) formed on a transparent object, such as a CRT panel, by matching pixel resolution of the machine vision system (16) to the geometric pattern of holes in the opaque layer (15). Preferably, multiple cameras (24) and light sources (23) are synchronously scanned across each CRT panel to obtain a signal having a signal-to-noise ratio and high frequency defect data which is processed to determine the defects in real-time. The pixel resolution is matched so as to maximise the signal-to-noise ratio of the signal.</p> |
