Integrated circuit test socket having compliant lid and mechanical advantage latch

摘要

A test socket for integrated circuits includes a base, a lid, and a latch providing a mechanical advantage. The base includes a nest which may move translationally and rotationally relative to the base. The nest is biased upward by coil springs mounted in the base. Spring-loaded contact pins extend through the base and the nest to make electrical connections between the integrated circuit and a circuit board to which the test socket is attached. The base also includes a nest support mounted below the nest to limit the downward travel of the nest to a selected distance. Furthermore, the nest has legs which connect to the base in a manner that limits upward travel to a selected distance. The lid includes a pressure pad which may move translationally relative to the lid. The pressure pad is spring-loaded by means of a flat spring contacting a ramp formed on the top side of the pressure pad in an inverted V-shape. The pressure pad can move vertically within the lid, thereby accommodating varied integrated circuit thicknesses. A link is pivotally attached at one end to the lid and at the other end to a latch for securing the lid in a closed position. The link provides a significant mechanical advantage in forcing the lid downward and closed to ensure good electrical contact between the integrated circuit device and the contact pins of the test socket.