发明名称 Nonvolatile memory device and manufacturing method thereof
摘要 A nonvolatile memory device and a manufacturing method thereof is disclosed. The device includes a gate electrode of a memory cell arranged in a memory cell region and having a floating gate electrode formed of a first conductive layer, an insulating film formed on the floating gate electrode and a control gate electrode formed of a second conductive layer on the insulating film; a gate electrode formed of a second conductive layer and arranged in a peripheral circuit region surrounding the memory cell region; a resistance device formed of the first conductive layer arranged in a boundary region between the memory cell region and the peripheral circuit region and/or the peripheral circuit region; an insulating film formed on a part of a surface of the resistance device; and a capping layer formed of the second conductive layer on the insulating film. Thus, generation of a stringer can be prevented so that malfunction of a device can be prevented.
申请公布号 US5789293(A) 申请公布日期 1998.08.04
申请号 US19960757247 申请日期 1996.11.27
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO, MYOUNG-KWAN;KIM, KEON-SOO
分类号 H01L21/8247;H01L27/105;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336 主分类号 H01L21/8247
代理机构 代理人
主权项
地址
您可能感兴趣的专利