发明名称 Baseband measurement of RF power amplifier distortion
摘要 An RF power amplifier distortion measurement system measures amplitude and phase distortion of a microwave/RF power amplifier by phase quadrature down-conversion of each of an RF amplifier's input signal and amplified output signals to baseband in-phase (I) and quadrature (Q) components, and performing RF amplifier distortion measurements on these down-converted baseband I and Q signals. The derived error measurement signal is remodulated to RF by phase quadrature up-conversion circuitry to produce an up-converted RF signal that corresponds to the RF distortion component contained in the RF output signal produced by the RF power amplifier.
申请公布号 US5789927(A) 申请公布日期 1998.08.04
申请号 US19960672576 申请日期 1996.06.28
申请人 SPECTRIAN 发明人 BELCHER, DONALD K.
分类号 G01R23/20;(IPC1-7):G01R23/20;H03G3/20 主分类号 G01R23/20
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