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经营范围
发明名称
ROM TEST CIRCUIT
摘要
申请公布号
KR0119771(Y1)
申请公布日期
1998.08.01
申请号
KR19920013115U
申请日期
1992.07.15
申请人
LG SEMICONDUCTOR CO.,LTD
发明人
LEE, SANG-ILL
分类号
H03K17/00;(IPC1-7):H03K17/00
主分类号
H03K17/00
代理机构
代理人
主权项
地址
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