| 摘要 |
The procedure for locating faults in an electronic circuit includes observation during the period when the circuit (100) is switched on during the period when the supply voltage rises from zero, or a predetermined low threshold, to its normal reference operating value. A curve is recorded representing a parameter relating to the consumption of current by the circuit (100) during this transitional period. The information which is recorded is compared with cells stored in a library of such curves (3), the individual entries within this library being typical of each of the possible faults within the circuit. According to the degree of concordance between the recorded curve and those stored values, the probability of a particular fault is determined and the necessary replacement part identified. |
