发明名称 Method of forming a metallic oxide semiconductor
摘要 A method of forming MOS components provides that after the formation of the gate and the doped source/drain regions, a polysilicon layer is deposited and planarized using a chemical-mechanical polishing method. The resulting unremoved polysilicon layer acts as source/drain terminals. Through these arrangements, the ion doped source/drain regions will have shallow junctions, yet their junction integrity will not be compromised by subsequent contact window etching and metallization processes. Furthermore, the front-end processes for forming the MOS component provide a good planar surface that offers great convenience for the performance of subsequent back-end processes.
申请公布号 US5786255(A) 申请公布日期 1998.07.28
申请号 US19970863426 申请日期 1997.05.27
申请人 UNITED MIROELECTRONICS CORPORATION 发明人 YEH, WEN-KUAN;CHEN, COMING;CHOU, JIH-WEN
分类号 H01L21/336;H01L29/417;(IPC1-7):H01L21/336 主分类号 H01L21/336
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