发明名称 Method of making an SOI transistor
摘要 A lateral bipolar transistor capable of forming a narrow-sized diffusion region, such as a base width, is disclosed. The transistor exhibits no scattering in the direction of the depth of the width of the diffusion region. Emitter resistance is reduced by varying an impurity diffusion source at substantially a uniform concentration in a semiconductor portion and forming a diffusion region by diffusion from the impurity diffusion source. The bipolar transistor has an SOI structure. A method of making such device is also disclosed.
申请公布号 US5786258(A) 申请公布日期 1998.07.28
申请号 US19970786879 申请日期 1997.01.23
申请人 SONY CORPORATION 发明人 MIWA, HIROYUKI;GOMI, TAKAYUKI;KATO, KATSUYUKI
分类号 H01L29/73;H01L21/22;H01L21/331;H01L21/38;(IPC1-7):H01L21/331 主分类号 H01L29/73
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