发明名称 |
Oblique incidence interferometer with fringe scan drive |
摘要 |
An oblique incidence interferometer capable of fringe scanning by use of a fringe scan drive association with a first or second diffraction grating member of the interferometer to drive the associated grating member step by step over a micrometric distance in a direction perpendicular to a path of light in travel in a straightforward direction. Laser light from a light source 20 is diffracted into a zero order diffraction wave L1 in travel in a straightforward direction and a +1 order diffraction wave L2 by a first diffraction grating member 26 of a grating assembly 41. The grating assembly 41 is vertically movably supported on a surface plate 42 by a pair of level support members 43 each having a stratified leaf spring structure. The grating assembly 41 sits on a piezoelectric actuator 45 which serves as a fringe scan drive for driving the first diffraction grating member 26 over a micrometric distance in the vertical direction. As the first diffraction grating member 26 is moved in a direction perpendicular to the light path of incident light, +1 order diffraction wave incident on a specimen 28 is shifted in phase, causing a displacement of a predetermined extent to interference fringes as observed through an image sensor 32.
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申请公布号 |
US5786896(A) |
申请公布日期 |
1998.07.28 |
申请号 |
US19960650994 |
申请日期 |
1996.05.21 |
申请人 |
FUJI PHOTO OPTICAL CO., LTD. |
发明人 |
HIZUKA, MASATOSHI |
分类号 |
G01B9/02;G01B11/30;(IPC1-7):G01B9/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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