发明名称 Process for electrical insulation in microelectronics, applicable in narrow cavities, by deposition of oxide in the viscous state and corresponding device
摘要 The invention relates to a process for electrical insulation of conductive or semiconductor materials of a substrate, characterized in that it comprises at least the following steps: (a) at least one so-called conformal layer of insulating oxide is deposited on the predetermined regions of the substrate to be insulated; (b) a layer of planarizing oxide precursor is deposited on the predetermined regions by chemical reaction in plasma phase of a tetraalkylsilicate and of hydrogen peroxide; (c) at least one layer of insulating oxide is deposited on the predetermined regions; and (d) a conversion annealing operation is carried out. It also relates to the semiconductor devices and integrated-circuit elements having insulated narrow cavities.
申请公布号 US5786039(A) 申请公布日期 1998.07.28
申请号 US19960645983 申请日期 1996.05.14
申请人 FRANCE TELECOM 发明人 BROUQUET, PIERRE
分类号 H01L21/312;H01L21/316;H01L21/762;(IPC1-7):H05H1/24 主分类号 H01L21/312
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