发明名称 WAFER HOLDING JIG
摘要 PROBLEM TO BE SOLVED: To prevent interposition of foreign matter and deformation of a wafer held by a working pressure, in a wafer holding jig used for grinding or polishing the semiconductor wafer. SOLUTION: In this jig, a porous holding surface for vacuum holding a wafer W is divided into a central region A in the center and an outer side region B in the outside thereof, porosity of the outer side region B is formed smaller than porosity of the central region A. An external diameter of the central region A is formed less than an external diameter of the wafer W, an external diameter of the outer side region B is formed in the external diameter of the wafer W or more, also a vacuum introducing path 5 is made to communicate with the central region A.
申请公布号 JPH10193260(A) 申请公布日期 1998.07.28
申请号 JP19960357981 申请日期 1996.12.27
申请人 SHIN ETSU HANDOTAI CO LTD;NAGANO DENSHI KOGYO KK 发明人 TAKEI TOKIO;NAKAMURA SUSUMU
分类号 B24B7/22;B24B37/30;H01L21/304 主分类号 B24B7/22
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