发明名称 PROCEDE DE FORMATION D'INTERCONNEXIONS DANS UN CIRCUIT INTEGRE
摘要 The invention provides a method for producing wirings (67, 70, 75) and contacts (60) in an integrated circuit comprising the steps of: forming insulated gate components on a semiconductor substrate (10); applying a photo-reducible dielectric layer (80) to cover the substrate; etching holes (45, 50, 55) and forming contacts; photo-reducing the dielectric to increase its conductivity; covering the resulting structure with an interconnect layer (64); etching the interconnect layer to define wirings in electrical contact with the contacts (60); and oxidising the dielectric to reduce its conductivity. <IMAGE>
申请公布号 FR2748601(B1) 申请公布日期 1998.07.24
申请号 FR19960006018 申请日期 1996.05.07
申请人 SGS THOMSON MICROELECTRONICS SA 发明人 PAPADAS CONSTANTIN
分类号 H01L21/3213;H01L21/768;H01L23/532;(IPC1-7):H01L21/321;H01L23/528 主分类号 H01L21/3213
代理机构 代理人
主权项
地址