发明名称 Method of forming silicon dioxide film containing germanium nanocrystals
摘要 The present invention provides a method of forming a silicon dioxide film containing germanium (Ge) nanocrystals, including the steps of (a) depositing Ge doped silicon dioxide on a substrate by means of atmospheric pressure chemical vapor deposition by which Si-based organic source, Ge-based organic source and ozone are to be reacted with one another, and (b) annealing the thus deposited Ge doped silicon dioxide film under non-reactive or reducing gas atmosphere at a temperature sufficient to break Ge-O bonds. The present invention makes it possible to grow Ge nanocrystals in a silicon dioxide film so that the Ge nanocrystals have a size sufficient to perform quantum confinement effects, and thereby provides a film suitable for fabrication of new optical devices and electronic devices utilizing non-linear optical characteristics.
申请公布号 US5783498(A) 申请公布日期 1998.07.21
申请号 US19960654121 申请日期 1996.05.28
申请人 NEC CORPORATION 发明人 DOTTA, ACHYUT KUMAR
分类号 H01L21/3105;H01L21/316;H01L33/34;(IPC1-7):H01L21/31;H01L21/469 主分类号 H01L21/3105
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