发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form a wiring electrode having satisfactory contact performance. SOLUTION: In the case of covering a contact hole formed at an insulating film, first aluminum or a wiring material 214 containing aluminum as a main component is formed as a film, and a film 215 containing element belonging to groups 12 to 15 as a main component is formed. It is heat-treated at 400 deg.C in an atmosphere containing hydrogen for 0.5 to 2hrs to give fluidity to the material, thereby realizing an effective contact.
申请公布号 JPH10189481(A) 申请公布日期 1998.07.21
申请号 JP19960317139 申请日期 1996.11.13
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 SUZAWA HIDEOMI;FUKUCHI KUNIHIKO;YAMAZAKI SHUNPEI
分类号 H01L21/28;H01L21/285;H01L21/3205;H01L21/336;H01L21/768;H01L23/52;H01L23/532;H01L29/786;(IPC1-7):H01L21/28;H01L21/320 主分类号 H01L21/28
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