发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To form a wiring electrode having satisfactory contact performance. SOLUTION: In the case of covering a contact hole formed at an insulating film, first aluminum or a wiring material 214 containing aluminum as a main component is formed as a film, and a film 215 containing element belonging to groups 12 to 15 as a main component is formed. It is heat-treated at 400 deg.C in an atmosphere containing hydrogen for 0.5 to 2hrs to give fluidity to the material, thereby realizing an effective contact. |
申请公布号 |
JPH10189481(A) |
申请公布日期 |
1998.07.21 |
申请号 |
JP19960317139 |
申请日期 |
1996.11.13 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
SUZAWA HIDEOMI;FUKUCHI KUNIHIKO;YAMAZAKI SHUNPEI |
分类号 |
H01L21/28;H01L21/285;H01L21/3205;H01L21/336;H01L21/768;H01L23/52;H01L23/532;H01L29/786;(IPC1-7):H01L21/28;H01L21/320 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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