发明名称 |
Extended bond pads with a plurality of perforations |
摘要 |
Extension areas of a metal layer electrically connected to the original die bond pad allow for testing connections to be made. In this way, the connection area used for the final packaging of the die will not be damaged. The extension areas can be removed along with the testing connections. The use of perforations and/or underlayer sections can aid in the removal of the extension area. The extension area can extend over a passivation layer so that the basic die design need not be changed.
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申请公布号 |
US5783868(A) |
申请公布日期 |
1998.07.21 |
申请号 |
US19960716134 |
申请日期 |
1996.09.20 |
申请人 |
INTEGRATED DEVICE TECHNOLOGY, INC. |
发明人 |
GALLOWAY, TERRY R. |
分类号 |
H01L23/485;H01L23/58;(IPC1-7):H01L23/48;H01L29/54 |
主分类号 |
H01L23/485 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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