发明名称 |
METHOD AND SYSTEM FOR DEPOSITING FAR-ULTRAVIOLET PHOTORESIST |
摘要 |
PROBLEM TO BE SOLVED: To realize a stabilized deposition with high photosensitivity by introducing a precursor gas containing methyl silane into a deposition chamber and subjecting the precursor gas to plasma polymerization by applying RF power to electrodes in the chamber. SOLUTION: Pressure in a chamber 15 is stabilized at a level between 1Torr and 2Torr. After a substrate is heated up to 50 deg.C-200 deg.C, a precursor gas of methyl silane is introduced at a flow rate of 20-150sccm into the chamber and a plasma is generated thus depositing a film. Power being applied to plasma electrodes is in the range of 50-200W. Area of the power electrode is preferably set at about 103 cm" so that the power per unit area thereof will be in the range of 0.05-0.20Wcm<2> . |
申请公布号 |
JPH10189440(A) |
申请公布日期 |
1998.07.21 |
申请号 |
JP19970307399 |
申请日期 |
1997.11.10 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
WEIDMAN TIMOTHY;SUGIARTO DIAN |
分类号 |
G03F7/38;B05D7/24;C23C16/30;C23C16/509;G03F7/075;G03F7/16;H01L21/02;H01L21/027;H01L21/31;(IPC1-7):H01L21/027 |
主分类号 |
G03F7/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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