发明名称 Gallium arsenide metal-semiconductor FET with gate electrode
摘要 The MESFET has a semiconductor region (3) with intermediate concentration of first conductivity, lying between low doped channel and drain regions of first conductivity. A highly doped semiconductor region (8) lies between one end of the gate electrode (7) and the drain region. The highly doped semiconductor region layer is separated from the gate electrode and the channel region is wider than the gate electrode length. The gate electrode and the semiconductor region with intermediate concentration are not in mutual contact.
申请公布号 DE19738166(A1) 申请公布日期 1998.07.16
申请号 DE19971038166 申请日期 1997.09.01
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 NODA, MINORU, TOKIO/TOKYO, JP;KASAI, NOBUYUKI, TOKIO/TOKYO, JP;SONODA, TAKUJI, TOKIO/TOKYO, JP
分类号 H01L21/265;H01L21/338;H01L29/08;(IPC1-7):H01L29/78;H01L21/336 主分类号 H01L21/265
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