发明名称 COMPONENT INSPECTING DEVICE
摘要 PROBLEM TO BE SOLVED: To miniaturize a device and reduce the cost by specifying the voltage range of a current source which may be dropped by the operation of an active element when the output current of a prescribed current value is outputted from the current source within a reference voltage range, and inspecting the quality of the active element based on the output voltage. SOLUTION: An operator specifies an allowable range, e.g.±20%, for the voltage value of the output voltage V0 stored in a memory as a reference daum. A CPU calculates a reference voltage range and stores it in the memory. An output current of a prescribed current value is fed to the equivalent input circuit of an active element 23, e. g. a photodiode 24 and the equivalent output circuit, e.g. a photo-transistor 25, from a constant-current source 21, and the active element 23 is judged as satisfactory when the voltage value of the output voltage V0 of the constant-current source 21 measured by a voltage measuring circuit 22 is within the prescribed reference voltage range. This device can be miniaturized and the cost can be reduced without requiring a constant-voltage source, a resistor, and a relay.
申请公布号 JPH10186003(A) 申请公布日期 1998.07.14
申请号 JP19960358247 申请日期 1996.12.26
申请人 HIOKI EE CORP 发明人 UEHARA SATOSHI
分类号 G01R31/26;G01R31/00;G01R31/28;G01R31/316;(IPC1-7):G01R31/28 主分类号 G01R31/26
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