| 摘要 |
A universal, fixtureless automatic test equipment is provided, capable of accessing opposite surfaces of any workpiece, simultaneously, for functionality testing. The workpiece can be freely placed anywhere on the test area, regardless of orientation, without the need for pre-test registration, alignment, or any kind of securing means. The test area of a universal fixtureless automatic test equipment, according to the teachings of the present invention, is made up of Independent Test Modules (ITMs). A test area may be configured from any number of ITMs, as desired. The ITMs can be individually selected for testing various functions of a respective section of a workpiece under test, and for independent electrical functioning. A typical ITM is made up of a plurality of semiconductor dies. Dies are similarly structured with matrices of selectable memorized bidirectional switching cells. Each switching cell is connected to a terminal-pad on the surface of the die. The terminal-pads extend to a test mattress of highly dense, compressible micronic bumps by means of a Adapter/Pitch Translator. These bumps function as independent test electrodes and are dimensioned to provide two positive features: to guarantee that each tested element on a workpiece corresponds with at least two of the test electrodes, and that the test electrodes are dimensioned to prevent shortages between adjacent pairs of tested elements.
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