发明名称 Methods for fabricating electrode structures including oxygen and nitrogen plasma treatments
摘要 A method for fabricating an integrated circuit capacitor includes the steps of forming a first electrode on a microelectronic substrate, and plasma treating the first electrode with a with a plasma of a gas including nitrogen and oxygen. A dielectric film is formed on the plasma treated first electrode opposite the microelectronic substrate. A second electrode is formed on the dielectric film opposite the plasma treated first electrode.
申请公布号 US5780115(A) 申请公布日期 1998.07.14
申请号 US19970806145 申请日期 1997.02.25
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK, IN-SUNG;LEE, BYOUNG-TAEK
分类号 H01L27/04;H01L21/02;H01L21/822;H01L21/8242;H01L27/108;(IPC1-7):H05H1/00;B05D3/06 主分类号 H01L27/04
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