发明名称 Method for heating or cooling wafers
摘要 Gas-loaded thermal conditioning is used to cause the temperature of a substrate to approach that of a high thermal inertia temperature-controlled plate by adjustable pressure of gas above the substrate, so as to press the substrate against the plate. There is no mechanical contact with the substrate except the plate which it rests on, and there is no danger of overheating or overcooling.
申请公布号 US5778968(A) 申请公布日期 1998.07.14
申请号 US19960654334 申请日期 1996.05.28
申请人 BROOKS AUTOMATION INC. 发明人 HENDRICKSON, RUTH ANN;HOFMEISTER, CHRISTOPHER;MUKA, RICHARD S.
分类号 C23C16/458;C23C16/46;C23F1/08;C23F4/00;C30B25/10;C30B31/12;H01L21/00;H01L21/324;H01L21/683;(IPC1-7):F25B29/00 主分类号 C23C16/458
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