发明名称 Scanning electron microscope
摘要 A stage on which a sample is placed is driven through feed screws rotated by pulse motors which are controlled by a micro-step drive control method. Backlash quantities and feed screw pitch errors have previously been obtained and stored in a memory, and when the stage is to be driven, a stage controller corrects the backlash and pitch errors.
申请公布号 US5780853(A) 申请公布日期 1998.07.14
申请号 US19960749214 申请日期 1996.11.14
申请人 NIKON CORPORATION 发明人 MORI, FUTOSHI;FUKAZAWA, KAZUHIKO;HIROSE, HIROSHI;KOHAMA, YOSHIAKI
分类号 H01J37/20;(IPC1-7):H01J37/20 主分类号 H01J37/20
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