发明名称 Asymmetric contacted metal-semiconductor-metal photodetectors
摘要 A metal-semiconductor-metal (MSM) photodetector, specifically a new, improved low noise device is disclosed. The disclosed device is a MSM photodiode in which the cathode and anode are made of different materials with optimal Schottky barrier heights. One of these materials is chosen to provide a high ratio of Schottky barrier height to hole transport and the other to provide a high ratio of Schottky barrier height to electron transport. The disclosed MSM photodetector is designed to allow each Schottky barrier to be individually optimized to the point that a wide bandgap Schottky barrier enhancement layer and its associated heterointerface may become unnecessary. Elimination of the charge buildup at the heterointerface enhances carrier extraction resulting in photodetectors with elevated quantum efficiency and enhanced bandwidths.
申请公布号 US5780916(A) 申请公布日期 1998.07.14
申请号 US19950541417 申请日期 1995.10.10
申请人 UNIVERSITY OF DELAWARE 发明人 BERGER, PAUL R.;GAO, WEI
分类号 H01L31/108;(IPC1-7):H01L21/095;H01L29/47 主分类号 H01L31/108
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