发明名称 Transistors with reduced surface level - differences
摘要 <p>Thin layer of dielectric, which can be attacked selectively relative to SiO2 and can be a diffusion barrier for O2- ions and acts as a screen against oxidation, is deposited on a silicon slice. It is masked and attacked to disclose Si in zones where a thick oxide layer is required; the layer is produced by thermal oxidation. The dielectric is selectively removed and known steps areused to produce as MOS or bipolar transistor or a diode. Preferably the dielectric is Si3NH4 or Al2O3, or a Si oxynitride.</p>
申请公布号 FR2053271(A7) 申请公布日期 1971.04.16
申请号 FR19700027629 申请日期 1970.07.27
申请人 GENERALE SEMICONDUTTORI 发明人
分类号 H01L21/00;H01L21/32;H01L21/762;(IPC1-7):01L7/00 主分类号 H01L21/00
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