发明名称 Method of fabricated embedded dynamic random access memory
摘要 Using the method of dual damascence, by forming and patterning only one dielectric layer 18, the contact windows 22, 24, 26 with different depth are formed. In addition, the metal layer formed within the metal connecting regions are used as interconnects without further processing.
申请公布号 GB9809771(D0) 申请公布日期 1998.07.08
申请号 GB19980009771 申请日期 1998.05.07
申请人 UNITED MICROELECTRONICS CORPORATION 发明人
分类号 H01L27/04;H01L21/285;H01L21/822;H01L21/8242;H01L27/108 主分类号 H01L27/04
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