发明名称 THERMOPOWER MAPPING OF SUPERCONDUCTING CUPRATES
摘要 <p>PCT No. PCT/NZ93/00022 Sec. 371 Date Dec. 30, 1994 Sec. 102(e) Date Dec. 30, 1994 PCT Filed Apr. 5, 1993 PCT Pub. No. WO93/20591 PCT Pub. Date Oct. 14, 1993The invention comprises a method for determining the hole or electron concentration, transition temperature, ratio Tc/Tc(max), or state of doping of a material capable of exhibiting superconductivity when cooled below its critical temperature, by measuring the thermopower of a sample of the material above the critical temperature of the material and determining from the thermopower the hole or electron concentration, transition temperature, ratio Tc/Tc(max), or state of doping of the material as to whether it is underdoped, overdoped or optimally doped. The sample may be differentially heated and/or cooled to generate a temperature difference across the sample, the temperature difference across the sample measured, the voltage across the sample measured, and the hole concentration or similar determined from the measured temperature difference and the measured voltage. Means for determining the hole concentration, transition temperature, or doping of the material is also claimed.</p>
申请公布号 EP0634056(B1) 申请公布日期 1998.07.08
申请号 EP19930909091 申请日期 1993.04.05
申请人 TALLON, JEFFERY LEWIS;COOPER, JOHN ROBERT;OBERTELLI, SANDRO DAVID 发明人 TALLON, JEFFERY LEWIS;COOPER, JOHN ROBERT;OBERTELLI, SANDRO DAVID
分类号 G01K7/00;(IPC1-7):H01L39/24;G01N27/00 主分类号 G01K7/00
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