发明名称 Exposure mask, method of producing the same, exposure mask producing apparatus, and method of forming surface profile on material using exposure mask
摘要 A two-dimensional shape of a dotted pattern and optical densities of dots or sizes of dots having the same optical density are calculated as write data on the basis of a target distribution of transmittance. The dotted pattern is optically written on a photosensitive medium in accordance with the calculated write data, using a beam from a light source whose output is stepwise or sequentially variable. A latent dotted pattern on the photosensitive medium is developed, thereby obtaining an exposure mask having a desired two-dimensional distribution of transmittance expressed by the dotted pattern and the optical densities of dots or the sizes of dots having the same optical density.
申请公布号 US5776639(A) 申请公布日期 1998.07.07
申请号 US19960629224 申请日期 1996.04.08
申请人 RICOH OPTICAL INDUSTRIES, CO., LTD. 发明人 UMEKI, KAZUHIRO;SATO, SHOSEN
分类号 G03F1/08;G03F1/00;G03F1/14;G03F1/68;G03F1/76;G03F7/20;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F1/08
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