发明名称 C4 Pb/Sn evaporation process
摘要 A process of Pb/Sn evaporation eliminates haloes in the manufacture of solder bump interconnects. This robust process of forms solder bump interconnects and reduces critical molebdnum mask sensitivity. Vacuum evaporation through which Pb/Sn C4 pads are deposited is performed by maintaining parallel temperature gradients between the molybdenum mask and silicon wafer, thus resulting in elimination of connecting haloes and yield losses.
申请公布号 US5776790(A) 申请公布日期 1998.07.07
申请号 US19960608162 申请日期 1996.02.28
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 STARR, STEPHEN GEORGE;KUTT, JOHN CONRAD;ZALOKAR, JR., ROBERT HENRY
分类号 C23C14/04;C23C14/54;H01L21/60;(IPC1-7):H01L21/285 主分类号 C23C14/04
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