发明名称 |
Integrated device with a structure for protection against high electric fields |
摘要 |
An integrated device including a structure for protection against electric fields. The protection structure may include a first region of conducting material electrically connected to the gate/source region of the device at a first potential. The protection structure may also include a second region of conducting material electrically connected to the drain region of the device at a second potential differing from the first. In one embodiment, the first region of conducting material is comb-shaped, and includes a first number of fingers separated by a plurality of gaps. The second region of conducting material includes portions extending at the aforementioned gaps to form a comb structure. Thus, the body of semiconductor material of the device sees a protection region formed by a pair of interlocking comb structures at an intermediate potential between the first and second potentials.
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申请公布号 |
US5777366(A) |
申请公布日期 |
1998.07.07 |
申请号 |
US19950553154 |
申请日期 |
1995.11.07 |
申请人 |
SGS-THOMSON MICROELECTRONICS S.R.L. |
发明人 |
CONTIERO, CLAUDIO;DEPETRO, RICCARDO |
分类号 |
H01L21/8234;H01L27/088;H01L29/06;H01L29/417;H01L29/423;H01L29/78;(IPC1-7):H01L23/62 |
主分类号 |
H01L21/8234 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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