发明名称 UV light sensitive die-pac for securing semiconductor dice during transport
摘要 A structure for protecting semiconductor integrated microcircuit dice during shipping. The structure secures the position of the die atop an ultraviolet (UV) light penetratable plate using a UV light sensitive adhesive layer. Once the structure reaches its destination, prior to removal of the die, the adhesive layer is exposed to ultraviolet light. This exposure reduces the adhesiveness or coefficient of friction of the layer, thereby facilitating die removal from the structure. The UV sensitive adhesive does not leave contaminating silicon residue on the removed die. The invention may be realized using currently commercially available UV tape and a modified die-pac having a UV light penetratable window.
申请公布号 US5775510(A) 申请公布日期 1998.07.07
申请号 US19960659268 申请日期 1996.06.06
申请人 MICRON TECHNOLOGY, INC. 发明人 HODGES, JOE
分类号 H01L21/673;H01L21/68;(IPC1-7):B65D85/30;B65D73/00 主分类号 H01L21/673
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