发明名称 Verfahren zur Herstellung einer Speicherzellenanordnung
摘要 In order to manufacture a memory cell configuration comprising a first series of memory cells including a vertical MOS transistor and a second series of memory cells without MOS transistor, the memory cells being arranged along the opposing flanks of strip-shaped pits, tiled memory cells are built one after the other along said pits (5). The spacing between the memory cells is determined according to a spacer technology enabling to meet the space need per memory cell, i.e. 1F<2>, where F represents the minimum structural quantity specific to said technology.
申请公布号 DE19653107(A1) 申请公布日期 1998.07.02
申请号 DE19961053107 申请日期 1996.12.19
申请人 SIEMENS AG, 80333 MUENCHEN, DE 发明人 HOFMANN, FRANZ, DR., 80995 MUENCHEN, DE;WILLER, JOSEPH, DR., 85521 RIEMERLING, DE;REISINGER, HANS, DR., 82031 GRUENWALD, DE;KRAUTSCHNEIDER, WOLFGANG, DR., 83104 TUNTENHAUSEN, DE;BASSE, PAUL-WERNER V., DIPL.-ING., 82515 WOLFRATSHAUSEN, DE
分类号 H01L21/8246;H01L27/112;(IPC1-7):H01L21/824;H01L29/78 主分类号 H01L21/8246
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