发明名称 Semiconductor device production
摘要 A process for forming two bipolar transistors with different properties on a semiconductor substrate (1) involves simultaneously forming a connecting base layer (5), for connecting an extrinsic (graft) base layer of one bipolar transistor and an epitaxially grown intrinsic base layer (12), and at least part of a base layer (6) of the other bipolar transistor. Also claimed is a similar process comprising (a) forming a first insulating layer on the semiconductor substrate (1); (b) opening the layer above regions in which the bipolar transistor base layers are to be formed and simultaneously doping impurities into the regions; and (c) annealing to form the connecting base layer of one bipolar transistor and the base layer of the other bipolar transistor.
申请公布号 DE19757685(A1) 申请公布日期 1998.07.02
申请号 DE1997157685 申请日期 1997.12.23
申请人 SONY CORP., TOKIO/TOKYO, JP 发明人 GOMI, TAKAYUKI, TOKIO/TOKYO, JP
分类号 H01L29/73;H01L21/331;H01L21/82;H01L21/8222;H01L27/06;H01L29/732;(IPC1-7):H01L21/331 主分类号 H01L29/73
代理机构 代理人
主权项
地址