发明名称 |
Semiconductor device production |
摘要 |
A process for forming two bipolar transistors with different properties on a semiconductor substrate (1) involves simultaneously forming a connecting base layer (5), for connecting an extrinsic (graft) base layer of one bipolar transistor and an epitaxially grown intrinsic base layer (12), and at least part of a base layer (6) of the other bipolar transistor. Also claimed is a similar process comprising (a) forming a first insulating layer on the semiconductor substrate (1); (b) opening the layer above regions in which the bipolar transistor base layers are to be formed and simultaneously doping impurities into the regions; and (c) annealing to form the connecting base layer of one bipolar transistor and the base layer of the other bipolar transistor.
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申请公布号 |
DE19757685(A1) |
申请公布日期 |
1998.07.02 |
申请号 |
DE1997157685 |
申请日期 |
1997.12.23 |
申请人 |
SONY CORP., TOKIO/TOKYO, JP |
发明人 |
GOMI, TAKAYUKI, TOKIO/TOKYO, JP |
分类号 |
H01L29/73;H01L21/331;H01L21/82;H01L21/8222;H01L27/06;H01L29/732;(IPC1-7):H01L21/331 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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