发明名称 METHOD AND DEVICE FOR MEASURING PELLICLE FILM HEIGHT
摘要 PROBLEM TO BE SOLVED: To confirm the working distance between a pellicle film and a measurement optical system without reducing a throughput when measuring a pattern such as a mask and a reticle using the pellicle film. SOLUTION: The initial value of the height of a pellicle film 9 and atmospheric pressure data and temperature data near a pellicle 8 when obtaining the initial value are obtained by a pressure sensor 4 and a thermistor 5. After that, atmospheric pressure data and temperature data near the pellicle 8 are obtained at each fixed time and the height of the pellicle film 9 is calculated based on the atmospheric pressure data and temperature data and the initial value of the height of the pellicle film 9, thus confirming the working distance between a measurement optical system 2 and the pellicle 8.
申请公布号 JPH10176918(A) 申请公布日期 1998.06.30
申请号 JP19960338709 申请日期 1996.12.18
申请人 NIKON CORP 发明人 SUZUKI YASUHIRO
分类号 G01B21/02;G03F1/62;H01L21/027;H01L21/66 主分类号 G01B21/02
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