发明名称 CONTACT GATE STRUCTURE AND ITS METHOD
摘要 PROBLEM TO BE SOLVED: To secure a reinforced flexibility and adaptability for the application to various manufacturing technologies such as CMOS technology by a method wherein a contact gate, a polysilicon layer and a conductive layer are successively formed on a source/drain regions adjacent to a field oxide. SOLUTION: An undoped polysilicon layer 50 is formed on a field oxide 14, a gate 20, a contact gate 28 and source/drain regions 40 to form a doped region thereon and further forming a conductive layer 70 on top of it. That is, in order to form the contact to source/drain regions 40 adjacent to a field oxide 14, the three stages as follows are used i.e., the first stage of forming the contact gate at least partly on a field oxide 14, the second stage of forming the polysilicon layer 50 on the contact 28 and the source/drain regions 40 so that the contact gate structure provided with the flexibility and adaptability may be erected.
申请公布号 JPH10178107(A) 申请公布日期 1998.06.30
申请号 JP19970339042 申请日期 1997.12.09
申请人 TEXAS INSTR INC <TI> 发明人 NIUYA TAKAYUKI
分类号 H01L21/3205;H01L21/285;H01L21/768;H01L21/8238;H01L21/8242;H01L27/092;H01L27/108 主分类号 H01L21/3205
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