| 摘要 |
PROBLEM TO BE SOLVED: To shorten the diagnostic time when no fault is detected and to point out in details the fault area if a fault is detected by preparing a normal diagnostic function which has 8 short diagnostic time and a detailed diagnostic function which points out in details the faulty area against detection of a fault. SOLUTION: A test execution control part 2 carries out successively the normal diagnoses 3 to 7 and performs an error check operation 8. If an error is checked during the execution of the diagnoses 3 to 7, a detailed test execution preparation part 10 starts its operation. In the diagnoses 3 to 7, such test items that can specify a defective substrate are carried out and accordingly the diagnostic time is shortened. The part 10 can prepare to perform a detailed test corresponding to each diagnostic area based on the specific one of diagnoses 3 to 7 where a fault is detected. When a detailed test is ready, a detailed test 11 is carried out and the detailed information on the fault is obtained. Then the detailed information is stored in an internal RAM of a fault information storage part 12. |
