CALIBRATION METHOD OF IC TESTER,申请号JP19960334268-传众专利搜索

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发明名称	CALIBRATION METHOD OF IC TESTER
摘要
申请公布号	JPH10170603(A)	申请公布日期	1998.06.26
申请号	JP19960334268	申请日期	1996.12.13
申请人	ANDO ELECTRIC CO LTD	发明人	ITO KOICHI
分类号	G01R31/28;G01R31/319;G01R35/00;(IPC1-7):G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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