发明名称 MANUFACTURE OF SILICON SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a boron diffusion process which stably obtains a long life time. SOLUTION: After predeposition, first, a borosilicate glass layer 4 is etched and removed. Subsequently, a boron silicide layer 6 is oxidized at a low temperature of 600 deg.C or lower in an oxygen plasma or ultraviolet radiation ozone atmosphere, removed by etching, and drive-in diffused. Harmful impurities gettered in the boron silicide layer 6 are prevented from being diffused and introduced into a silicon crystal. Consequently, the life time of the silicon crystal after the diffusion of boron is stabilized and 80μs or longer can be obtained.
申请公布号 JPH10172913(A) 申请公布日期 1998.06.26
申请号 JP19960328207 申请日期 1996.12.09
申请人 HITACHI LTD 发明人 OIKAWA SABURO;MOCHIZUKI YASUHIRO;MURAKAMI SUSUMU;SANPEI ISAMU
分类号 H01L21/22;H01L21/223;(IPC1-7):H01L21/22 主分类号 H01L21/22
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