发明名称 Vapor deposition apparatus and vapor deposition method
摘要 <p>A vapor deposition apparatus for supplying raw-material gas into a reactor to form a thin film on a wafer substrate disposed in the reactor by vapor deposition, including at least a rotator for mounting the wafer substrate thereon, a treatment gas introducing port, a straightening vane having plural holes, and a wafer substrate feed-in/out port, wherein the lowermost portion of the wafer feed-in/out port is located at a predetermined height from the upper surface of the rotator, and the difference in height between the lowermost portion of the wafer feed-in/out port and the upper surface of the rotator is set to be larger than the thickness of a transition layer of the upper portion of the rotator. In a vapor deposition method, a wafer substrate is mounted on the rotator to form a thin film having little defect and uniform film thickness on the wafer substrate by using the vapor deposition apparatus. <IMAGE></p>
申请公布号 EP0849775(A2) 申请公布日期 1998.06.24
申请号 EP19970122152 申请日期 1997.12.16
申请人 TOSHIBA CERAMICS CO., LTD. 发明人 OHASHI, TADASHI;CHAKI, KATUHIRO;XIN, PING;FUJII, TATSUO;IWATA, KATSUYUKI;MITANI, SHINICHI;HONDA, TAKAAKI
分类号 C23C16/44;C23C16/455;C23C16/54;C30B25/14;H01L21/205;H01L21/31;(IPC1-7):H01L21/203;C23C14/24;C30B25/02;C23C14/56;C30B23/02 主分类号 C23C16/44
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