发明名称 Photoresist and compounds for composing the photoresist
摘要 There is provided a photoresist including (a) a resin composed of a polymer having a compound represented with the following general formula [1] within a structural unit thereof, and (b) a photo acid generator. <IMAGE> [1] wherein R1 represents a hydrogen atom, R2 represents a divalent hydrocarbon group including a bridged cyclic hydrocarbon group and having a carbon number in the range of 7 to 13 both inclusive, R3 and R4 represent a hydrocarbon group having a carbon number of 1 or 2, and R5 represents one of (a) a hydrocarbon group having a carbon number of 1 to 12, (b) a hydrocarbon group having a carbon number of 1 to 12 and replaced with an alkoxy group having a carbon number of 1 to 12, and (c) a hydrocarbon group having a carbon number of 1 to 12 and replaced with an acyl group having a carbon number of 1 to 13. The above mentioned photoresist produces no extra polymer by side reaction. Thus, the photoresist makes it possible to form a fine pattern without resist residue, and has superior thermal stability.
申请公布号 US5770346(A) 申请公布日期 1998.06.23
申请号 US19960763055 申请日期 1996.12.10
申请人 NEC CORPORATION 发明人 IWASA, SHIGEYUKI;NAKANO, KAICHIRO;MAEDA, KATSUMI;OHFUJI, TAKESHI;HASEGAWA, ETSUO
分类号 C07C62/38;C07C69/73;C08F20/26;C08F20/28;C09D133/04;C09D133/14;G03F7/004;G03F7/029;G03F7/033;G03F7/039;H01L21/027;(IPC1-7):G03F7/039 主分类号 C07C62/38
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